滤光片型号：Di01-R405/488/561/635/800-t3-25×36
Di01-R405/488/561/635/800-t3-25×36 多边缘多光子超分辨率/TIRF激光二向色镜透过率曲线，Semrock
405/488/561/635/800-1050 nm BrightLine 多边缘多光子超分辨率/TIRF激光二向色镜，25.2 mm x 35.6 mm，厚度 3 mm
针对荧光成像中最常用的激光器优化的二向色镜分束器，包括用于传统激光共聚焦显微镜（如共聚焦成像）的新型全固态激光器。该类别中的所有分束器在激光波长下都具有出色的反射率，并且具有抗反射（AR）镀膜，可极大地减少相干激光引起的成像伪影。这种二向色镜分束器经过优化，可以反射直径高达2.5毫米的激光光束，同时最大限度地减少反射波前差RWE。
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 92% 425 – 470 nm |
| Transmission Band 2 | Tavg > 92% 508 – 540 nm |
| Transmission Band 3 | Tavg > 92% 583 – 615 nm |
| Transmission Band 4 | Tavg > 92% 671 – 725 nm |
| Reflection Band 1 | Rabs > 94% 400 – 410 nm |
| Reflection Band 1 (p-pol) | Rabs > 90% 400 – 410 nm |
| Reflection Band 1 (s-pol) | Rabs > 98% 400 – 410 nm |
| Reflection Band 2 | Rabs > 94% 483 – 493 nm |
| Reflection Band 2 (p-pol) | Rabs > 90% 483 – 493 nm |
| Reflection Band 2 (s-pol) | Rabs > 98% 483 – 493 nm |
| Reflection Band 3 | Rabs > 94% 559 – 563 nm |
| Reflection Band 3 (p-pol) | Rabs > 90% 559 – 563 nm |
| Reflection Band 3 (s-pol) | Rabs > 98% 559 – 563 nm |
| Reflection Band 4 | Rabs > 94% 635 – 647 nm |
| Reflection Band 4 (p-pol) | Rabs > 90% 635 – 647 nm |
| Reflection Band 4 (s-pol) | Rabs > 98% 635 – 647 nm |
| Reflection Band 5 | Ravg > 94% 800 – 1050 nm |
| Reflection Band 5 (p-pol) | Ravg > 90% 800 – 1050 nm |
| Reflection Band 5 (s-pol) | Ravg > 98% 800 – 1050 nm |
| Edge Wavelength 1 | 420 nm |
| Edge Wavelength 2 | 501 nm |
| Edge Wavelength 3 | 577 nm |
| Edge Wavelength 4 | 662 nm |
| Edge Wavelength 5 | 735 nm |
| Laser Wavelength 3 | 559 +4/-0 nm, 561.4 nm |
| Laser Wavelengths 1 | 405 +/- 5 nm |
| Laser Wavelengths 2 | 488 +/- 5 nm |
| Laser Wavelengths 4 | 635 +7/-0 nm, 642 +/- 5 nm |
| Laser Wavelength 5 | 800 – 1050 nm |
| General Filter Specifications | Value |
| Angle of Incidence | 45 degrees with a shift of ~0.35%/degree (40 – 50 degrees) |
| Cone Half-angle | 0.5 degrees |
| Optical Damage Rating | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Maximum Reflected Laser Beam Diameter | 6 mm |
| Maximum Reflected Laser Beam Diameter | 16.7 mm |
| Nominal Flatness | < 1.4λ P-V per inch @ 632.8 nm |
| Nominal Flatness | < 0.19λ P-V per inch @ 632.8 nm |
| Reflected Wavefront Error | < 0.33λ P-V RWE @ 632.8 nm |
| Steepness | Standard |
| Flatness / RWE Classification | Super-resolution / TIRF |
| Group Delay Dispersion | ± 500 fs² over 800 – 1050 nm refl band for S-Pol and P-Pol |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
| Transverse Tolerance | ± 0.1 mm |
| Clear Aperture | ≥ 80% (elliptical) |
| Scratch-Dig | 60-40 |
| Substrate Type | Fused Silica |
| Filter Thickness (unmounted) | 3.0 mm |
| Substrate Thickness (3 mm, unmounted) | 3.0 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.1 mm |
| Substrate Thickness Tolerance (3 mm, unmounted) | ± 0.1 mm |
| Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |
