| Transmission Band 1 | 
Tavg > 93% 503.5 – 526.5 nm | 
| Transmission Band 2 | 
Tavg > 93% 560 – 615.5 nm | 
| Transmission Band 3 | 
Tavg > 93% 665.5 – 800 nm | 
| Reflection Band 1 | 
Rabs > 94% 471 – 491 nm | 
| Reflection Band 1 (p-pol) | 
Rabs > 90% 471 – 491 nm | 
| Reflection Band 1 (s-pol) | 
Rabs > 98% 471 – 491 nm | 
| Reflection Band 2 | 
Rabs > 94% 541.5 – 544.5 nm | 
| Reflection Band 2 (p-pol) | 
Rabs > 90% 541.5 – 544.5 nm | 
| Reflection Band 2 (s-pol) | 
Rabs > 98% 541.5 – 544.5 nm | 
| Reflection Band 3 | 
Rabs > 94% 632.8 – 647.1 nm | 
| Reflection Band 3 (p-pol) | 
Rabs > 90% 632.8 – 647.1 nm | 
| Reflection Band 3 (s-pol) | 
Rabs > 98% 632.8 – 647.1 nm | 
| Edge Wavelength 1 | 
499 nm | 
| Edge Wavelength 2 | 
553 nm | 
| Edge Wavelength 3 | 
658 nm | 
| Laser Wavelength 3 | 
632.8 nm, 635 +7/-0 nm, 647.1 nm | 
| Laser Wavelengths 1 | 
473 +/- 2 nm, 488 +3/-2 nm | 
| Laser Wavelengths 2 | 
543.5 nm | 
| Angle of Incidence | 
45 degrees with a shift of 0.35%/degree (40 – 50 degrees) | 
| Cone Half-angle | 
0.5 degrees | 
| Optical Damage Rating | 
2 J/cm² at 532 nm (for a 532nm filter) | 
| Reflected Wavefront Error | 
< 6λ P-V RWE @ 632.8 nm | 
| Steepness | 
Steep | 
| Flatness / RWE Classification    | 
Laser | 
| Transverse Dimensions (L x W) | 
25.2 mm x 35.6 mm | 
| Transverse Tolerance | 
± 0.1 mm | 
| Clear Aperture | 
≥ 80% (elliptical) | 
| Scratch-Dig | 
60-40 | 
| Substrate Type | 
Fused Silica | 
| Filter Thickness (unmounted) | 
1.05 mm | 
| Filter Thickness (unmounted) | 
1.05 mm | 
| Filter Thickness Tolerance (unmounted) | 
± 0.05 mm | 
| Filter Thickness Tolerance (unmounted) | 
± 0.05 mm | 
| Orientation | 
Reflective surface marked with part number – Orient in direction of incoming light |