Transmission Band 1 |
Tavg > 93% 503.5 – 526.5 nm |
Transmission Band 2 |
Tavg > 93% 560 – 615.5 nm |
Transmission Band 3 |
Tavg > 93% 665.5 – 800 nm |
Reflection Band 1 |
Rabs > 94% 471 – 491 nm |
Reflection Band 1 (p-pol) |
Rabs > 90% 471 – 491 nm |
Reflection Band 1 (s-pol) |
Rabs > 98% 471 – 491 nm |
Reflection Band 2 |
Rabs > 94% 541.5 – 544.5 nm |
Reflection Band 2 (p-pol) |
Rabs > 90% 541.5 – 544.5 nm |
Reflection Band 2 (s-pol) |
Rabs > 98% 541.5 – 544.5 nm |
Reflection Band 3 |
Rabs > 94% 632.8 – 647.1 nm |
Reflection Band 3 (p-pol) |
Rabs > 90% 632.8 – 647.1 nm |
Reflection Band 3 (s-pol) |
Rabs > 98% 632.8 – 647.1 nm |
Edge Wavelength 1 |
499 nm |
Edge Wavelength 2 |
553 nm |
Edge Wavelength 3 |
658 nm |
Laser Wavelength 3 |
632.8 nm, 635 +7/-0 nm, 647.1 nm |
Laser Wavelengths 1 |
473 +/- 2 nm, 488 +3/-2 nm |
Laser Wavelengths 2 |
543.5 nm |
Angle of Incidence |
45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
Cone Half-angle |
0.5 degrees |
Optical Damage Rating |
2 J/cm² at 532 nm (for a 532nm filter) |
Reflected Wavefront Error |
< 6λ P-V RWE @ 632.8 nm |
Steepness |
Steep |
Flatness / RWE Classification |
Laser |
Transverse Dimensions (L x W) |
25.2 mm x 35.6 mm |
Transverse Tolerance |
± 0.1 mm |
Clear Aperture |
≥ 80% (elliptical) |
Scratch-Dig |
60-40 |
Substrate Type |
Fused Silica |
Filter Thickness (unmounted) |
1.05 mm |
Filter Thickness (unmounted) |
1.05 mm |
Filter Thickness Tolerance (unmounted) |
± 0.05 mm |
Filter Thickness Tolerance (unmounted) |
± 0.05 mm |
Orientation |
Reflective surface marked with part number – Orient in direction of incoming light |