滤光片型号：Di03-R405/488/532/635-t3-25×36
Di03-R405/488/532/635-t3-25×36 四边缘超分辨率/TIRF激光二向色镜透过率曲线，Semrock
405/488/532/635 nm BrightLine 四边缘超分辨率/TIRF激光二向色镜，25.2 mm x 35.6 mm，厚度 3 mm
理想的二向色镜分束器，适用于荧光成像中最常用的激光器，包括用于高级显微镜的全固态激光器。该类别中的所有分束器在关键激光波长和更宽的反射带（用于光活化和超分辨率技术的紫外线）上都具有出色的反射率。此外，它们还具有扩展的透射区域——红外到1200或1600纳米，以及抗反射（AR）镀膜，以极大地减少相干激光引起的成像伪影。
Semrock的超分辨率/TIRF二向色镜有两种厚度可供选择，可提供优异的平坦度，极大地减少激光束点的焦点偏移和光学波前像差，从而实现TIRF、PALM、STORM、结构化照明和STED等流行的成像和超分辨率技术。
1 mm厚度上的反射波前差RWE为1λP-V，针对反射直径达10毫米的激光光束进行了优化，同时极大地减少了反射波前差RWE；
3 mm厚度上的反射波前差RWE为λ/5 P-V，针对反射直径高达22.5 mm的激光光束进行了优化，同时极大地减少了反射波前差RWE。
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 93% 426 – 462 nm |
| Transmission Band 2 | Tavg > 93% 502.5 – 518.5 nm |
| Transmission Band 3 | Tavg > 93% 550 – 613 nm |
| Transmission Band 4 | Tavg > 93% 663 – 1200 nm |
| Reflection Band 1 | Rabs > 94% 370 – 410 nm |
| Reflection Band 1 (p-pol) | Rabs > 90% 370 – 410 nm |
| Reflection Band 1 (s-pol) | Rabs > 98% 370 – 410 nm |
| Reflection Band 2 | Rabs > 94% 473 – 491 nm |
| Reflection Band 2 (p-pol) | Rabs > 90% 473 – 491 nm |
| Reflection Band 2 (s-pol) | Rabs > 98% 473 – 491 nm |
| Reflection Band 3 | Rabs > 94% 530.5 – 533.5 nm |
| Reflection Band 3 (p-pol) | Rabs > 90% 530.5 – 533.5 nm |
| Reflection Band 3 (s-pol) | Rabs > 98% 530.5 – 533.5 nm |
| Reflection Band 4 | Rabs > 94% 632.8 – 647.1 nm |
| Reflection Band 4 (p-pol) | Rabs > 90% 632.8 – 647.1 nm |
| Reflection Band 4 (s-pol) | Rabs > 98% 632.8 – 647.1 nm |
| Reflection Band 5 | Ravg > 90% 350 – 370 nm |
| Edge Wavelength 1 | 418.8 nm |
| Edge Wavelength 2 | 497.6 nm |
| Edge Wavelength 3 | 541.9 nm |
| Edge Wavelength 4 | 659.1 nm |
| Laser Wavelength 3 | 532 nm |
| Laser Wavelengths 1 | 375 +/- 3 nm, 405 +/- 5 nm |
| Laser Wavelengths 2 | 473 +2/-0 nm, 488 +3/-2 nm |
| Laser Wavelengths 4 | 632.8 nm, 635 +7/-0 nm, 647.1 nm |
| General Filter Specifications | Value |
| Angle of Incidence | 45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
| Cone Half-angle | 0.5 degrees |
| Optical Damage Rating | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Reflected Wavefront Error | < 0.2λ P-V RWE @ 632.8 nm |
| Steepness | Steep |
| Flatness / RWE Classification | Super-resolution / TIRF |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
| Transverse Tolerance | ± 0.1 mm |
| Clear Aperture | ≥ 80% (elliptical) |
| Scratch-Dig | 60-40 |
| Substrate Type | Fused Silica |
| Filter Thickness (unmounted) | 3.0 mm |
| Substrate Thickness (3 mm, unmounted) | 3.0 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.1 mm |
| Substrate Thickness Tolerance (3 mm, unmounted) | ± 0.1 mm |
| Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |
