473 nm BrightLine 超分辨率/TIRF二向色镜
- 激光二向色镜边缘波长 484 nm,
- 反射率Rabs > 94%, 457.9 – 478 nm
- 反射率Ravg > 90%, 350 – 457.9 nm
- 透过率Tavg > 93%, 486.6 – 1200 nm
- 平面度Flatness / 反射波前差RWE: Super-resolution / TIRF 级别
滤光片型号:Di03-R473-t1-25×36
Di03-R473-t1-25×36 超分辨率/TIRF 二向色镜透过率曲线,Semrock
473 nm BrightLine 超分辨率/TIRF 二向色镜,25.2 mm x 35.6 mm,厚度 1.1 mm
适用于荧光成像中最常用激光器的理想二向色镜分束器,包括全固态激光器。该类别中的所有分束器在关键激光波长和更宽的反射带(用于光活化和超分辨率技术的紫外线)上都具有出色的反射率。此外,它们还具有扩展的透射区域——红外到1200或1600纳米,以及抗反射(AR)镀膜,以极大限度地减少相干激光引起的成像伪影。
Semrock的超分辨率/TIRF二向色镜有两种厚度可供选择,可提供理想的平坦度,极大限度地减少激光束点的焦点偏移和光学波前像差,从而实现TIRF、PALM、STORM、结构化照明和STED等流行的成像和超分辨率技术。
Optical Specifications | Value |
---|---|
Transmission Band 1 | Tavg > 93% 486.6 – 1200 nm |
Reflection Band 1 | Rabs > 94% 457.9 – 478.0 nm |
Reflection Band 1 (p-pol) | Rabs > 90% 457.9 – 478.0 nm |
Reflection Band 1 (s-pol) | Rabs > 98% 457.9 – 478.0 nm |
Reflection Band 2 | Ravg > 90% 350.0 – 457.9 nm |
Edge Wavelength 1 | 484 nm |
Laser Wavelengths 1 | 473 ± 5 nm, 457.9 nm |
General Filter Specifications | Value |
Angle of Incidence | 45 degrees with a shift of 0.35%/degree (40 – 50 degrees) |
Cone Half-angle | 0.5 degrees |
Optical Damage Rating | Not tested |
Reflected Wavefront Error | < 1λ P-V RWE @ 632.8 nm |
Steepness | Steep |
Flatness / RWE Classification | Super-resolution / TIRF |
Physical Filter Specifications | Value |
Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
Transverse Tolerance | ± 0.1 mm |
Clear Aperture | ≥ 80% (elliptical) |
Scratch-Dig | 60-40 |
Substrate Type | Fused Silica |
Filter Thickness (unmounted) | 1.05 mm |
Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
Substrate Thickness Tolerance (1 mm, unmounted) | ± 0.05 mm |
Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |