Transmission Band 1 |
Tavg > 93% 414 – 450 nm, Tavg > 90% 414 – 450 nm (AOI = 45° ± 1.5°) |
Transmission Band 2 |
Tavg > 93% 499.5 – 530 nm, Tavg > 90% 499.5 – 530 nm (AOI = 45° ± 1.5°) |
Transmission Band 3 |
Tavg > 93% 580 – 611 nm, Tavg > 90% 580 – 611 nm (AOI = 45° ± 1.5°) |
Transmission Band 4 |
Tavg > 93% 661 – 701 nm, Tavg > 90% 661 – 701 nm (AOI = 45° ± 1.5°) |
Transmission Band 5 |
Tavg > 93% 768.5 – 849.5 nm, Tavg > 90% 768.5 – 849.5 nm (AOI = 45° ± 1.5°) |
Reflection Band 1 |
Ravg > 95% 350 – 404 nm |
Reflection Band 2 |
Ravg > 95% 461 – 487.5 nm |
Reflection Band 3 |
Ravg > 95% 543 – 566 nm |
Reflection Band 4 |
Ravg > 95% 626 – 644 nm |
Reflection Band 5 |
Ravg > 95% 721 – 749 nm |
Edge Wavelength 1 |
409 nm |
Edge Wavelength 2 |
493 nm |
Edge Wavelength 3 |
573 nm |
Edge Wavelength 4 |
652 nm |
Edge Wavelength 5 |
759 nm |
Angle of Incidence |
45 degrees |
Cone Half-angle |
0 ± 0 degrees |
Optical Damage Rating |
Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
Reflected Wavefront Error |
>> 6λ P-V RWE @ 632.8 nm |
Steepness |
Standard |
Flatness / RWE Classification |
Standard Epi-fluorescence |
Transverse Dimensions (L x W) |
25.2 mm x 35.6 mm |
Transverse Tolerance |
± 0.1 mm |
Clear Aperture |
≥ 80% (elliptical) |
Scratch-Dig |
60-40 |
Filter Thickness (unmounted) |
1.05 mm |
Filter Thickness (unmounted) |
1.05 mm |
Filter Thickness Tolerance (unmounted) |
± 0.05 mm |
Filter Thickness Tolerance (unmounted) |
± 0.05 mm |
Orientation |
Reflective surface marked with part number – Orient in direction of incoming light |