484 nm BrightLine 用于标准显微镜的荧光图像分离二向色镜
- 图像分离二向色镜边缘波长 484 nm
- 反射率Ravg > 95%， 350 – 475 nm
- 透过率Tavg > 93%， 492.3 – 950 nm
- 常用荧光团分离：DAPI / FITC
- 平面度Flatness / 反射波前差RWE: Image-splitting级别
FF484-FDi01-25×36
Description
484 nm BrightLine 用于标准显微镜的荧光图像分离二向色镜
滤光片型号：FF484-FDi01-25×36
Theoretical Spectrum for Part Number: FF484-FDi01-25×36
FF484-FDi01-25×36 荧光图像分离二向色镜透过率曲线，Semrock
484 nm BrightLine 用于标准显微镜的荧光图像分离二向色镜，25.2 mm x 35.6 mm，厚度 1.1 mm
Semrock BrightLine图像分离二向色镜分束器在按颜色分离光束以同时捕获多色图像时，为透射光和反射光提供了理想的图像质量。对于（FRET）和实时活细胞成像等应用，用户现在可以将两种、四种甚至更多的颜色分离到尽可能多的相机或单个相机传感器的感光区域上。对于大多数常见的成像系统，这些滤光片的出色平坦度几乎消除了反射光束中的像差。这种二向色镜分束器经过优化，可以反射直径高达10毫米的成像光束，同时最大限度地减少反射波前差RWE。
常见的荧光团图像分离：DAPI/FITC 或 BFP/GFP
滤光片参数：
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 93% 492.3 – 950 nm |
| Reflection Band 1 | Ravg > 95% 350 – 475 nm |
| Edge Wavelength 1 | 484 nm |
| Common Fluorophore Pair to Split | DAPI/FITC or BFP/GFP |
| General Filter Specifications | Value |
| Angle of Incidence | 45 ± 1.5 degrees |
| Cone Half-angle | 2 degrees |
| Optical Damage Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
| Reflected Wavefront Error | < 2λ P-V RWE @ 632.8 nm |
| Steepness | Standard |
| Flatness / RWE Classification | Image-splitting |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
| Transverse Tolerance | ± 0.1 mm |
| Clear Aperture | ≥ 80% (elliptical) |
| Scratch-Dig | 60-40 |
| Filter Thickness (unmounted) | 1.05 mm |
| Filter Thickness (unmounted) | 1.05 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
| Orientation | Reflective surface marked with part number – Orient in direction of incoming light |
