662 nm BrightLine 用于超分辨率显微镜的荧光图像分离二向色镜
- 图像分离二向色镜边缘波长 662 nm
- 反射率Ravg > 95%, 350 – 650 nm
- 透过率Tavg > 93%, 673.7 – 1200 nm
- 常用荧光团分离:TxRed / CY5
- 平面度Flatness / 反射波前差RWE: Image-splitting级别
滤光片型号:FF662-FDi02-t3-25×36
FF662-FDi02-t3-25×36 荧光图像分离二向色镜透过率曲线,Semrock
662 nm BrightLine 用于标准显微镜的荧光图像分离二向色镜,25.2 mm x 35.6 mm,厚度 3 mm
Semrock BrightLine图像分离二向色镜分束器在按颜色分离光束以同时捕获多色图像时,为透射光和反射光提供了理想的图像质量。对于(FRET)和实时活细胞成像等应用,用户现在可以将两种、四种甚至更多的颜色分离到尽可能多的相机或单个相机传感器的感光区域上。对于大多数常见的成像系统,这些滤光片的出色平坦度几乎消除了反射光束中的像差。
Semrock用于超分辨率显微镜的图像分离二向色镜在3mm厚的基板上提供了λ/5 P-V 的反射波前差RWE,可将反射成像光束的焦点偏移和光学波前像差降至极低。这些二向色镜可以用于直径大得多的成像光束,最大可达37毫米,同时在定制尺寸版本中极大限度地减少反射波前差RWE。
常见的荧光团图像分离:TxRed/Cy5
FF662-FDi01图像分离二向色镜分束器,适用于1mm基板上的标准显微镜,用于反射直径达10mm的成像光束,同时极大限度地减少反射波前差RWE。
Optical Specifications | Value |
---|---|
Transmission Band 1 | Tavg > 93% 673.7 – 1200 nm |
Reflection Band 1 | Ravg > 95% 350 – 650 nm |
Edge Wavelength 1 | 662 nm |
Common Fluorophore Pair to Split | TxRed/Cy5 |
General Filter Specifications | Value |
Angle of Incidence | 45 ± 1.5 degrees |
Cone Half-angle | 2 degrees |
Optical Damage Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
Reflected Wavefront Error | < 0.2λ P-V RWE @ 632.8 nm |
Steepness | Standard |
Flatness / RWE Classification | Image-splitting |
Physical Filter Specifications | Value |
Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
Transverse Tolerance | ± 0.1 mm |
Clear Aperture | ≥ 80% (elliptical) |
Scratch-Dig | 60-40 |
Filter Thickness (unmounted) | 3.0 mm |
Substrate Thickness (3 mm, unmounted) | 3.0 mm |
Filter Thickness Tolerance (unmounted) | ± 0.1 mm |
Substrate Thickness Tolerance (3 mm, unmounted) | ± 0.1 mm |
Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |