850 nm BrightLine 多光子 LaserMUX 合束/分束镜
- 多光子激光合束/分束, 边缘波长 850 nm
- 反射率Ravg > 95%, 670 – 815 nm
- 透过率Tavg > 93%, 890 – 2100 nm
- < 1/10 wave P-V 透射波前差
- < ± 100 fs² 群延迟色散,常见飞秒激光波长
- 平面度Flatness / 反射波前差RWE:Super-resolution / TIRF级别
滤光片型号:FF850-Di01-t1-25×36
FF850-Di01-t1-25×36合束/分束镜透过率曲线,Semrock
850 nm BrightLine 多光子 LaserMUX 合束/分束镜,25.2 mm x 35.6 mm,厚度1.1 mm
Optical Specifications | Value |
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Transmission Band 1 | Tavg > 93% 890 – 2100 nm over any 10 nm window |
Transmission Band 1 (p-pol) | Tavg > 95% 845 – 2100 nm |
Transmission Band 1 (s-pol) | Tavg > 90% 890 – 2100 nm |
Reflection Band 1 | Ravg > 95% 670 – 815 nm over any 10 nm window |
Reflection Band 1 (p-pol) | Ravg > 90% 670 – 815 nm |
Reflection Band 1 (s-pol) | Ravg > 98% 670 – 849 nm |
Edge Wavelength 1 | 850 nm |
General Filter Specifications | Value |
Angle of Incidence | 45 ± 1.5 degrees |
Cone Half-angle | 2 degrees |
Optical Damage Rating | 50 mJ/cm² @ 800 nm (50 fs pulse width); test pending; specification based on FS01 Mirror test results |
Transmitted Wavefront Error | λ/10 PV over CA @ 632.8 nm |
Reflected Wavefront Error | < 1λ P-V RWE @ 632.8 nm |
Steepness | Standard |
Flatness / RWE Classification | Super-resolution / TIRF |
Group Delay Dispersion Transmission (s-pol) 2 | ± 500 fs² over 913 – 2100 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (p-pol) 2 | ± 500 fs² over 683 – 812 nm |
Group Delay Dispersion Transmission (s-pol) 1 | ± 100 fs² over 965 – 2050 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (s-pol) 1 | ± 100 fs² over 670 – 828 nm |
Group Delay Dispersion Transmission (p-pol) 1 | ± 100 fs² over 917 – 2050 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (s-pol) 2 | ± 500 fs² over 670 – 840 nm |
Group Delay Dispersion Transmission (p-pol) 2 | ± 500 fs² over 873 – 2100 nm (excluding substrate, by design) |
Group Delay Dispersion Reflection (p-pol) 1 | ± 100 fs² over 691 – 795 nm |
Physical Filter Specifications | Value |
Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
Transverse Tolerance | ± 0.1 mm |
Clear Aperture | ≥ 85% (elliptical) |
Scratch-Dig | 60-40 |
Substrate Type | Fused Silica |
Filter Thickness (unmounted) | 1.05 mm |
Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
Substrate Thickness Tolerance (1 mm, unmounted) | ± 0.05 mm |
Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |
波长筛选 |
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