405/488/561 nm BrightLine Yokogawa转盘共聚焦二向色镜
- 用于Yokogawa CSU 转盘共聚焦扫描头的二向色镜
- 透过率Tavg > 90%, 400 – 410 nm; T > 90%, 488 nm & T > 90%, 561 nm
- 反射率Ravg > 95%, 422 – 473 nm; Ravg > 95%, 503 – 544 nm & Ravg > 95%, 578 – 750 nm
滤光片型号:Di01-T405/488/561-13x15x0.5

Di01-T405/488/561-13x15x0.5 Yokogawa转盘共聚焦二向色镜透过率曲线
405/488/561 nm BrightLine Yokogawa转盘共聚焦二向色镜,13 mm x 15 mm,厚度 0.5 mm
Semrock这款滤光片将卓越的性能与出色的耐用性相结合,专门针对所有横河CSU转盘共聚焦扫描头系统配置进行了优化。
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 90% 400 – 410 nm |
| Transmission Band 2 | T > 90% 488 nm |
| Transmission Band 3 | T > 90% 561 nm |
| Reflection Band 1 | Ravg > 95% 422 – 473 nm |
| Reflection Band 2 | Ravg > 95% 503 – 544 nm |
| Reflection Band 3 | Ravg > 95% 578 – 750 nm |
| Edge Wavelength 2 | 481 nm |
| Edge Wavelength 3 | 552 nm |
| Laser Wavelength 1 | 400 – 410 nm |
| Laser Wavelength 2 | 488 nm |
| Laser Wavelength 3 | 561 nm |
| General Filter Specifications | Value |
| Angle of Incidence | 45 ± 0 degrees |
| Cone Half-angle | 0.5° ± 0° |
| Optical Damage Rating | Not tested |
| Reflected Wavefront Error | < 6λ P-V RWE @ 632.8 nm |
| Steepness | Steep |
| Flatness / RWE Classification | Laser |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 13.0 mm x 15.0 mm |
| Transverse Tolerance | + 0.0 / – 0.2 mm |
| Clear Aperture | 11 mm x 11 mm (Square) |
| Scratch-Dig | 40-20 |
| Substrate Type | Fused Silica |
| Filter Thickness (unmounted) | 0.5 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.02 mm |
| Orientation | Unmarked (reflective coating towards sample) |