665 nm BrightLine 多光子荧光二向色镜
- 二向色镜边缘波长 665 nm
- 反射率Ravg > 98%， 350 – 650 nm
- 透过率Tavg > 93%， 680 – 1600 nm
- 平面度Flatness / 反射波前差RWE: Standard Epi-fluorescence 级别
FF665-Di02-25×36
Description
665 nm BrightLine 多光子荧光二向色镜
滤光片型号：FF665-Di02-25×36
Theoretical Spectrum for Part Number: FF665-Di02-25×36
FF665-Di02-25×36 多光子荧光二向色镜透过率曲线，Semrock
665 nm BrightLine 多光子荧光二向色镜，25.2 mm x 35.6 mm，厚度 1.1 mm
Semrock提供了一系列针对多光子应用中使用的脉冲激光器进行优化的二向色镜分束器。这些多光子二向色镜具有低GDD，有助于最小化透射激光光束的脉宽时间展宽，同时表现出具有非常高和平坦的反射和透射带的陡峭边缘。
这些是飞秒脉冲激光器的理想解决方案，如钛：蓝宝石（和OPO光参量振荡器）、掺钕和掺镱光纤和玻璃激光器，能够实现具有更好对比度的深层组织成像。
滤光片参数：
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 93% 680 – 1600 nm |
| Reflection Band 1 | Ravg > 98% 350 – 650 nm |
| Edge Wavelength 1 | 665 nm |
| General Filter Specifications | Value |
| Angle of Incidence | 45 ± 1.5 degrees |
| Cone Half-angle | 2 degrees |
| Optical Damage Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hours. |
| Reflected Wavefront Error | >> 6λ P-V RWE @ 632.8 nm |
| Steepness | Standard |
| Flatness / RWE Classification | Standard Epi-fluorescence |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
| Transverse Tolerance | ± 0.1 mm |
| Clear Aperture | ≥ 80% (elliptical) |
| Scratch-Dig | 60-40 |
| Filter Thickness (unmounted) | 1.05 mm |
| Filter Thickness (unmounted) | 1.05 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
| Orientation | Reflective surface marked with part number – Orient in direction of incoming light |
