835 nm BrightLine 多光子三光子短波通超分辨率/TIRF二向色镜
- 三光子多光子二向色镜边缘波长 835 nm
- 透过率Tavg > 90%， 400 – 820 nm
- 反射率Ravg, avg-pol > 94%， 1200 – 1350 nm, 1600 – 1870 nm
- 平面度 Flatness / 反射波前差RWE: Super-resolution / TIRF 级别
FF835-SDi01-t1-25×36
Description
835 nm BrightLine 多光子三光子短波通超分辨率/TIRF二向色镜
滤光片型号：FF835-SDi01-t1-25×36
Theoretical Spectrum for Part Number: FF835-SDi01-t1-25×36
FF835-SDi01-t1-25×36多光子三光子短波通超分辨率/TIRF二向色镜透过率曲线，Semrock
835 nm BrightLine 多光子三光子短波通超分辨率/TIRF二向色镜，25.2 mm x 35.6 mm，厚度 1.1 mm
创新的短波通二向色镜分束器，针对标准落射荧光显微镜配置中的3光子激光激发进行了优化，具有反射激发光和透过荧光发射。
双光子（红色）和三光子（绿色和红色）激发区域是飞秒脉冲激光器的理想选择，如钛：蓝宝石、OPO或OPA以及掺钕和掺镱激光器，可实现对比度提高的深部组织成像。这种多光子二向色镜具有低反射GDD，有助于极大限度地减少反射的1300 nm和1700 nm激光脉冲的脉宽时间展宽，以及非常高和平坦的反射和透射带。
Semrock的超分辨率/TIRF二向色镜有两种厚度可供选择，可提供优异的平坦度，极大地减少激光束点的焦点偏移和光学波前像差，从而实现TIRF、PALM、STORM、结构化照明、STED和多光子成像等流行的成像和超分辨率技术。
1 mm厚度上的反射波前差RWE为2.5λP-V ，针对反射直径达6 mm的激光光束进行了优化，同时将RWE降至极低；
3 mm厚度上的反射波前差RWE为λ/3 P-V，针对反射直径高达16.7 mm的激光光束进行了优化，同时极大地减少了反射波前差RWE。
滤光片参数：
| Optical Specifications | Value |
|---|---|
| Transmission Band 1 | Tavg > 90% 400 – 820 nm |
| Transmission Band 2 | Tavg > 80% 400 – 420 nm (Rolling Window: 10 nm) |
| Transmission Band 3 | Tavg > 90% 420 – 820 nm (Rolling Window: 10 nm) |
| Reflection Band 1 | Ravg > 94% 1200 – 1350 nm |
| Reflection Band 1 (p-pol) | Ravg > 90% 1200 – 1350 nm |
| Reflection Band 1 (s-pol) | Ravg > 98% 1200 – 1350 nm |
| Reflection Band 2 | Ravg > 94% 1600 – 1870 nm |
| Reflection Band 2 (p-pol) | Ravg > 90% 1600 – 1870 nm |
| Reflection Band 2 (s-pol) | Ravg > 98% 1600 – 1870 nm |
| Edge Wavelength 1 | 835 nm |
| Laser Wavelengths 1 | 1200 – 1350 nm |
| Laser Wavelengths 2 | 1600 – 1870 nm |
| General Filter Specifications | Value |
| Angle of Incidence | 45 ± 1.5 degrees |
| Cone Half-angle | 2 degrees |
| Optical Damage Rating | 1 J/cm² @ 532 nm (10 ns pulse width) |
| Maximum Reflected Laser Beam Diameter | 6 mm |
| Nominal Flatness | < 1.4λ P-V per inch @ 632.8 nm |
| Reflected Wavefront Error | < 2.5λ P-V RWE @ 632.8 nm |
| Steepness | Standard |
| Flatness / RWE Classification | Super-resolution / TIRF |
| Group Delay Dispersion 1 | ± 1500 fs² over 1200 – 1350 nm refl band for S-Pol and P-Pol |
| Group Delay Dispersion 2 | ± 750 fs² over 1600 – 1870 nm refl band for S-Pol and P-Pol |
| Physical Filter Specifications | Value |
| Transverse Dimensions (L x W) | 25.2 mm x 35.6 mm |
| Transverse Tolerance | ± 0.1 mm |
| Clear Aperture | ≥ 80% (elliptical) |
| Scratch-Dig | 60-40 |
| Substrate Type | Fused Silica |
| Filter Thickness (unmounted) | 1.05 mm |
| Filter Thickness Tolerance (unmounted) | ± 0.05 mm |
| Substrate Thickness Tolerance (1 mm, unmounted) | ± 0.05 mm |
| Orientation | Reflective surface marked with laser dot – Orient in direction of incoming light |
